Search results for "Residual carrier"

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Phase-Noise and Amplitude-Noise Measurement of DACs and DDSs

2019

This article proposes a method for the measurement of Phase Noise (PN, or PM noise) and Amplitude Noise (AN, or AM noise) of Digital-to-Analog Converters (DAC) and Direct Digital Synthesizers (DDS) based on modulation-index amplification. The carrier is first reduced by a controlled amount (30-40 dB) by adding a reference signal of nearly equal amplitude and opposite in phase. Then, residual carrier and noise sidebands are amplified and sent to a conventional PN analyzer. The main virtues of our method are: (i) the noise specs of the PN analyzer are relaxed by a factor equal to the carrier suppression ratio; and, (ii) the capability to measure the AN using a PN analyzer, with no need for th…

[SPI.OTHER]Engineering Sciences [physics]/OtherSpectrum analyzerPhysics - Instrumentation and DetectorsAcoustics and UltrasonicsAtomic Physics (physics.atom-ph)AcousticsFast Fourier transformFOS: Physical sciences02 engineering and technology01 natural sciencesPhysics - Atomic PhysicsAmplitude modulationBackground noise0103 physical sciencesPhase noiseFlicker noise[PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det]Electrical and Electronic Engineering010301 acousticsInstrumentationPhysicsNoise measurementFlicker010401 analytical chemistryInstrumentation and Detectors (physics.ins-det)Converters021001 nanoscience & nanotechnologyResidual carrier[PHYS.PHYS.PHYS-GEN-PH]Physics [physics]/Physics [physics]/General Physics [physics.gen-ph]0104 chemical sciencesNoiseAmplitudeDevice under test0210 nano-technology
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